Difference: FibTest (1 vs. 2)
Revision 202 Oct 2009 - Main.RubenDiaz
Assessment of FIB instrumentsVisit to NIHOverallThe instrument at the NIH is a FEI Quanta SEM with a focused ion beam. The focused ion beam is the usual Gallium source, and the images are captured after a beam of electrons coming from a FEG are directed towards the sample. I was greeted at 9AM in room 403 of Building 50 at NIH by Gavin Murphy, who is a postdoc in Sriram Subramaniam's lab. Gavin has a background on TEM tomography, as he got his degree in the laboratory of Grant Jensen at Caltech.Sample preparationThe sample was prepared in the usual way. It was a resin embedded sample, with Osmium and lead citrate. He says that similar results are obtained from HP frozen samples which are freeze substituted. | ||||||||
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| < < | The specimens are trimmed to be ~1mm^3 on each side, glued to the SEM stubb with gold paint and sputter coated with gold. Then the SEM stubb is placed in the chamber (at least another 3 specimens can be placed in the same stubb) and this is evacuated. Venting the chamber took a long time (~10 minutes), but it is unlikely that this is a feature of the instrument. | |||||||
| > > | The specimens are trimmed to be ~1mm^3 on each side, glued to the SEM stubb with gold paint and sputter coated with gold. Then the SEM stubb is placed in the chamber (at least another 3 specimens can be placed in the same stubb) and this is evacuated. Venting the chamber took a long time (~10 minutes), but this was likely an unusual glitch. | |||||||
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| < < | After the chamber was under vacuum, the e-beam was used to collect a low magnification image of the specimen. This low mag image was correlated with an image of the specimen from the | |||||||
| > > | After the specimens were mounted in their holder and the chamber was under vacuum (which took just a few minutes), the e-beam was used to collect a low magnification image of the specimen. This low mag image was correlated with an image of the specimen from the light microscope, in order to find the area of interest where to start digging the trench. | |||||||
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Revision 121 Sep 2009 - Main.RubenDiaz
Assessment of FIB instrumentsVisit to NIHOverallThe instrument at the NIH is a FEI Quanta SEM with a focused ion beam. The focused ion beam is the usual Gallium source, and the images are captured after a beam of electrons coming from a FEG are directed towards the sample. I was greeted at 9AM in room 403 of Building 50 at NIH by Gavin Murphy, who is a postdoc in Sriram Subramaniam's lab. Gavin has a background on TEM tomography, as he got his degree in the laboratory of Grant Jensen at Caltech.Sample preparationThe sample was prepared in the usual way. It was a resin embedded sample, with Osmium and lead citrate. He says that similar results are obtained from HP frozen samples which are freeze substituted. The specimens are trimmed to be ~1mm^3 on each side, glued to the SEM stubb with gold paint and sputter coated with gold. Then the SEM stubb is placed in the chamber (at least another 3 specimens can be placed in the same stubb) and this is evacuated. Venting the chamber took a long time (~10 minutes), but it is unlikely that this is a feature of the instrument. After the chamber was under vacuum, the e-beam was used to collect a low magnification image of the specimen. This low mag image was correlated with an image of the specimen from the
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